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Damage generation and annealing in Ga+ implanted GaAs/(Ga,Al)As quantum wells.

Authors :
Vieu, C.
Schneider, M.
Launois, H.
Descouts, B.
Source :
Journal of Applied Physics. 5/15/1992, Vol. 71 Issue 10, p4833. 10p.
Publication Year :
1992

Abstract

Presents information on a study which investigated the damage generation and its annealing behavior in gallium arsenide (GaAs)/(Ga,aluminum (Al))As quantum wells (QW) after Ga[⊃+] implantation at room temperature, by transmission electron microscopy. Implantation and annealing of the GaAs/GaAlAs single QW; Discussion on the implantation and annealing of the GaAs/AlAs multiple QW; Differential amorphization and annealing; Segregation of defects in GaAs.

Details

Language :
English
ISSN :
00218979
Volume :
71
Issue :
10
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7634539
Full Text :
https://doi.org/10.1063/1.350626