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Magnetic properties and microstructures of dense branching morphology observed in Bi/Al/Mn/SiO multilayers.

Authors :
Shang, C. H.
Huang, D.
Luo, H. L.
Wang, Y. J.
Kong, L. C.
Source :
Journal of Applied Physics. 5/15/1993, Vol. 73 Issue 10, p6118. 3p.
Publication Year :
1993

Abstract

Deals with a study wherein a type of domain structure observed in the annealed bismuth aluminum manganese silicon oxide films was described. Methods; Results; Discussion.

Details

Language :
English
ISSN :
00218979
Volume :
73
Issue :
10
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7634994
Full Text :
https://doi.org/10.1063/1.352720