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Wavelength selective infrared microscopy: A nondestructive and quick method for the investigation of buried structures in optoelectronic devices.
- Source :
-
Journal of Applied Physics . 11/15/1986, Vol. 60 Issue 10, p3401. 6p. 5 Black and White Photographs, 3 Diagrams. - Publication Year :
- 1986
-
Abstract
- Presents an optical method to control the geometry of buried layers in optoelectronic heterostructures. Description of the technique used; Characteristic near-band-gap spectral variations at different wavelengths; Analysis of the mushroom-type indium-gallium-arsenic-phosphorus/indium-phosphorus laser structure.
- Subjects :
- *OPTOELECTRONICS
*HETEROSTRUCTURES
*INDIUM compounds
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 60
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7636166
- Full Text :
- https://doi.org/10.1063/1.337637