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Calculation of hole mobility in doped SiGe alloys using a Monte Carlo method with a bond orbital band structure.

Authors :
Liou, Tsyr-Shyang
Wang, Tahui
Chang, Chun-Yen
Source :
Journal of Applied Physics. 10/15/1994, Vol. 76 Issue 8, p4749. 4p. 1 Chart, 5 Graphs.
Publication Year :
1994

Abstract

Provides information on a study that calculated hole mobility in strained Si[sub1-x]Ge[subx]/Si(001) layers as functions of temperature and doping concentrations for various germanium contents using a Monte Carlo technique. Description on the Monte Carlo model; Results and discussion on the study.

Details

Language :
English
ISSN :
00218979
Volume :
76
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7637949
Full Text :
https://doi.org/10.1063/1.357244