Cite
Impedance-frequency characteristics of metal-oxide-semiconductor structures on polycrystalline silicon.
MLA
Lakshmi, M. V. S., and K. Ramkumar. “Impedance-Frequency Characteristics of Metal-Oxide-Semiconductor Structures on Polycrystalline Silicon.” Journal of Applied Physics, vol. 63, no. 3, Feb. 1988, p. 934. EBSCOhost, https://doi.org/10.1063/1.340036.
APA
Lakshmi, M. V. S., & Ramkumar, K. (1988). Impedance-frequency characteristics of metal-oxide-semiconductor structures on polycrystalline silicon. Journal of Applied Physics, 63(3), 934. https://doi.org/10.1063/1.340036
Chicago
Lakshmi, M. V. S., and K. Ramkumar. 1988. “Impedance-Frequency Characteristics of Metal-Oxide-Semiconductor Structures on Polycrystalline Silicon.” Journal of Applied Physics 63 (3): 934. doi:10.1063/1.340036.