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Dielectric properties and complex defect in (Sr1-xBi2/3x)TiO3 ceramics.

Authors :
Chen, Ang
Zhi, Yu
Source :
Journal of Applied Physics. 5/1/1992, Vol. 71 Issue 9, p4451. 4p.
Publication Year :
1992

Abstract

Presents a study on the defect structure of the dielectric ceramics using the positron annihilation technique. Experimental details; Results and discussion; Conclusion.

Details

Language :
English
ISSN :
00218979
Volume :
71
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7648976
Full Text :
https://doi.org/10.1063/1.350787