Back to Search
Start Over
Transmission electron microscope observation of lattice image of AlxGa1-xAs-AlyGa1-yAs superlattices with high contrast.
- Source :
-
Journal of Applied Physics . 11/1/1985, Vol. 58 Issue 9, p3456. 7p. 6 Black and White Photographs, 5 Diagrams, 2 Charts, 1 Graph. - Publication Year :
- 1985
-
Abstract
- Reports on transmission electron microscope observation on cross sections of molecular beam epitaxy-grown Al[subx]Ga[sub1-x]As-Al[suby]Ga[sub1-y] superlattice samples. Determination of layer thicknesses; Differences in the shape of the lattice points between the samples; Computer simulation of the lattice image of superlattice for the electron beam incident.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 58
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7649237
- Full Text :
- https://doi.org/10.1063/1.335767