Oblique, off-specular, linear, and nonlinear observations with a scanning micron wavelength acoustic microscope.

Authors :: Tan, M. R. T.
Ransom, H. L.
Cutler, C. C.
Chodorow, M.
Source :: Journal of Applied Physics. 6/1/1985, Vol. 57 Issue 11, p4931. 5p. 4 Black and White Photographs, 2 Diagrams.
Publication Year :: 1985
Abstract: Presents a study which constructed a micron wavelength acoustic microscope for the observation of third-order nonlinear products. Information on how the micron wavelength acoustic microscope works; Instrument characteristics; Results of observations.

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