Strain mapping of ultrathin epitaxial ZnTe and MnTe layers embedded in CdTe.

Presents a study which used high-resolution electron microscopy to investigate the morphology of ultrathin pseudomorphic zinc telluride and manganese telluride strained layers grown in cadmium telluride. Measurement of the local distortions of the crystal lattice; Principles of distortion analysis method in the experimental images of the cadmium telluride/zinc telluride superlattices; Comparison with results obtained by high-resolution x-ray diffraction; Limitation of the method.