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Microstructure and composition of composite SiO2/TiO2 thin films.

Authors :
Gluck, N. S.
Sankur, H.
Heuer, J.
DeNatale, J.
Gunning, W. J.
Source :
Journal of Applied Physics. 3/1/1991, Vol. 69 Issue 5, p3037. 9p.
Publication Year :
1991

Abstract

Presents a study which examined the microstructure and composition of the silicon dioxide/titanium dioxide and digital gradient-index films using transmission electron microscopy. Growth of the digital structures; Modification of the properties of dielectric thin films; Results of Auger electron spectroscopy.

Subjects

Subjects :
*MICROSTRUCTURE
*SILICA
*TITANIUM dioxide
*TRANSMISSION electron microscopy

Details

Language :
English
ISSN :
00218979
Volume :
69
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7652288
Full Text :
https://doi.org/10.1063/1.348591
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