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An all refractory NbN Josephson junction medium scale integrated circuit process.

Authors :
Kerber, G. L.
Cooper, J. E.
Fry, H. W.
King, G. R.
Morris, R. S.
Spargo, J. W.
Toth, A. G.
Source :
Journal of Applied Physics. 11/1/1990, Vol. 68 Issue 9, p4853. 8p. 7 Black and White Photographs, 2 Diagrams, 4 Charts, 3 Graphs.
Publication Year :
1990

Abstract

Discusses the fabrication and electrical performance of an all refractory niobium-nitrogen medium scale integrated circuit process. Fabrication of Josephson junctions; Plasma etching of in situ radio frequency sputter deposited trilayers of niobium-nitrogen/magnesium-oxygen/niobium-nitrogen; Use of a deposited silicon dioxide film for wiring and resistor insulation.

Details

Language :
English
ISSN :
00218979
Volume :
68
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7655096
Full Text :
https://doi.org/10.1063/1.346145