Cite
Short-range order, microstructure and their correlation with light-induced degradation in hydrogenated amorphous silicon deposited at high growth rates by cathode heating technique.
MLA
Chattopadhyay, S., et al. “Short-Range Order, Microstructure and Their Correlation with Light-Induced Degradation in Hydrogenated Amorphous Silicon Deposited at High Growth Rates by Cathode Heating Technique.” Journal of Applied Physics, vol. 76, no. 9, Nov. 1994, p. 5208. EBSCOhost, https://doi.org/10.1063/1.357239.
APA
Chattopadhyay, S., Sharma, S. N., Banerjee, R., Bhusari, D. M., Kshirsagar, S. T., Chen, Y., & Williamson, D. L. (1994). Short-range order, microstructure and their correlation with light-induced degradation in hydrogenated amorphous silicon deposited at high growth rates by cathode heating technique. Journal of Applied Physics, 76(9), 5208. https://doi.org/10.1063/1.357239
Chicago
Chattopadhyay, S., S. N. Sharma, Ratnabali Banerjee, D. M. Bhusari, S. T. Kshirsagar, Yan Chen, and D. L. Williamson. 1994. “Short-Range Order, Microstructure and Their Correlation with Light-Induced Degradation in Hydrogenated Amorphous Silicon Deposited at High Growth Rates by Cathode Heating Technique.” Journal of Applied Physics 76 (9): 5208. doi:10.1063/1.357239.