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Thermal stability of aluminum-tin-oxide thin-film interface.

Authors :
Eser, E.
Ramos, F.
Grez, J.
Source :
Journal of Applied Physics. 8/1/1988, Vol. 64 Issue 3, p1238. 7p. 4 Diagrams, 8 Graphs.
Publication Year :
1988

Abstract

Presents a study that investigated the thermal stability of aluminum-tin-oxide thin-film interface. Degradation kinetics of the contact resistivity; Interface chemistry; Conclusion.

Details

Language :
English
ISSN :
00218979
Volume :
64
Issue :
3
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7656741
Full Text :
https://doi.org/10.1063/1.341841