Cite
Characterization of hydrogen passivation and carbon self-compensation of highly C-doped GaAs by means of x-ray diffraction.
MLA
Liu, Q., et al. “Characterization of Hydrogen Passivation and Carbon Self-Compensation of Highly C-Doped GaAs by Means of x-Ray Diffraction.” Journal of Applied Physics, vol. 79, no. 2, Jan. 1996, p. 710. EBSCOhost, https://doi.org/10.1063/1.360815.
APA
Liu, Q., Brennemann, A., Hardtdegen, H., Lindner, A., Prost, W., & Tegude, F.-J. (1996). Characterization of hydrogen passivation and carbon self-compensation of highly C-doped GaAs by means of x-ray diffraction. Journal of Applied Physics, 79(2), 710. https://doi.org/10.1063/1.360815
Chicago
Liu, Q., A. Brennemann, H. Hardtdegen, A. Lindner, W. Prost, and F.-J. Tegude. 1996. “Characterization of Hydrogen Passivation and Carbon Self-Compensation of Highly C-Doped GaAs by Means of x-Ray Diffraction.” Journal of Applied Physics 79 (2): 710. doi:10.1063/1.360815.