Back to Search
Start Over
Methods for calculating electrostatic quantities due to a free charge in a nanoscale three-dimensional tip/base junction.
- Source :
-
Journal of Applied Physics . 10/15/1995, Vol. 78 Issue 8, p4888. 7p. - Publication Year :
- 1995
-
Abstract
- Presents information on a study wherein the exact solutions for fully three-dimensional electrostatic quantities due to a free charge in a nanoscale tip/base junction, such as the scanning-tunneling microscope, are given for the problem as modeled in the prolate-spheroidal coordinate system. Methods; Results; Discussion.
- Subjects :
- *ELECTROSTATICS
*SCANNING tunneling microscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 78
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7663805
- Full Text :
- https://doi.org/10.1063/1.359777