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Fabrication of MOSFETs by 3D soft UV-nanoimprint

Authors :
Koo, Namil
Schmidt, Mathias
Mollenhauer, Thomas
Moormann, Christian
Schlachter, Florian
Kurz, Heinrich
Source :
Microelectronic Engineering. Sep2012, Vol. 97, p85-88. 4p.
Publication Year :
2012

Abstract

Abstract: So far, metal oxide semiconductor field-effect transistors (MOSFETs) have been fabricated using either optical lithography or imprint lithography with an alignment step between the different layers. Here, we report on the new process for the fabrication of top gate MOSFETs where the number of fabrication steps is reduced significantly. The 3D topography of a top gate MOSFET using as primary master is inversely replicated into a flexible mold that is subsequently transferred to the imprint resist layer. By reactive ion etching, this self aligned 3D pattern is transferred into the underlying semiconductor stack creating functional transistor structures. Preliminary electrical characterizations demonstrate fully operational transistor functions. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
01679317
Volume :
97
Database :
Academic Search Index
Journal :
Microelectronic Engineering
Publication Type :
Academic Journal
Accession number :
79480474
Full Text :
https://doi.org/10.1016/j.mee.2012.05.015