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Complex domain structure in relaxed PbTiO3 thick films grown on (100)cSrRuO3//(100)SrTiO3 substrates.
- Source :
-
Journal of Applied Physics . Sep2012, Vol. 112 Issue 5, p052001. 5p. - Publication Year :
- 2012
-
Abstract
- Domain structures of epitaxial PbTiO3 films grown on (100)cSrRuO3//(100)SrTiO3 substrates by metalorganic chemical vapor deposition were investigated by x-ray diffraction (XRD) and piezoresponse force microscopy (PFM) techniques. It was found that with increasing film thickness, the domain structure changed from simple (001) polarization orientation to a complicated mixture of (001) and (100) orientations. PFM mappings showed that in the thicker films (∼1100 nm), the zigzag (001)/(100) domain boundaries made an angle of approximately 87° instead of 90° typically observed in (001)/(100) domain patterns in thinner (<300 nm) films. Full-relaxed tilting angle θ1 + θ2 + θ3 = 3.4° obtained from cross-sectional profile analysis of topological step-terrace structure was in good agreement with 3.4° and 3.6° angle values obtained from XRD measurements and theoretical prediction, respectively. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 112
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 80228728
- Full Text :
- https://doi.org/10.1063/1.4746078