Cite
Probability calculation of read failures in nano-scaled SRAM cells under process variations
MLA
Aghababa, Hossein, et al. “Probability Calculation of Read Failures in Nano-Scaled SRAM Cells under Process Variations.” Microelectronics Reliability, vol. 52, no. 11, Nov. 2012, pp. 2805–11. EBSCOhost, https://doi.org/10.1016/j.microrel.2012.04.022.
APA
Aghababa, H., Ebrahimi, B., Afzali-Kusha, A., & Pedram, M. (2012). Probability calculation of read failures in nano-scaled SRAM cells under process variations. Microelectronics Reliability, 52(11), 2805–2811. https://doi.org/10.1016/j.microrel.2012.04.022
Chicago
Aghababa, Hossein, Behzad Ebrahimi, Ali Afzali-Kusha, and Massoud Pedram. 2012. “Probability Calculation of Read Failures in Nano-Scaled SRAM Cells under Process Variations.” Microelectronics Reliability 52 (11): 2805–11. doi:10.1016/j.microrel.2012.04.022.