Finding the Invisible Contaminants in CMOS Image Sensor Pixels: The DCS Technique.

The article offers information on the dark current spectroscopy (DCS) technique which can be used for the detection and identification of metallic contaminants present at low concentration in electronic equipments. It informs that the technique works to estimate the concentration and helps in determining its dissemination mode during the contamination process. It provides information on the working of complementary metal-oxide semiconductor (CMOS) image sensor.