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Stability analysis in multiwall carbon nanotube bundle interconnects

Authors :
Haji-Nasiri, Saeed
Faez, Rahim
Moravvej-Farshi, Mohammad Kazem
Source :
Microelectronics Reliability. Dec2012, Vol. 52 Issue 12, p3026-3034. 9p.
Publication Year :
2012

Abstract

Abstract: Based on the transmission line model (TLM), we present an exact and general transfer function formula, useful for both single multiwall carbon nanotube (MWCNT) and MWCNT bundle interconnects. Using the standard parameters for 22-nm technology node we perform the Nyquist stability analysis, to investigate the dependence of the degree of relative stability for both single and bundle interconnects on the number of walls in each MWCNT its geometry and also on the bundle geometry. The numerical results, for 1- to 30-μm long interconnects composed of 3- to 7-wall-CNTs, show that by increasing the length or the outer shell diameter, both single and bundle interconnects become more stable. On the other hand, an increase in the number of walls, keeping the outer shell diameter constant, increases the relative stability of the single MWCNT and decreases that of the bundle interconnects. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262714
Volume :
52
Issue :
12
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
83299267
Full Text :
https://doi.org/10.1016/j.microrel.2012.06.147