Back to Search
Start Over
Correlation of Dynamic Parameter Modification and ASET Sensitivity in a Shunt Voltage Reference.
- Source :
-
IEEE Transactions on Nuclear Science . Dec2012 Part 1, Vol. 59 Issue 6, p2756-2763. 8p. - Publication Year :
- 2012
-
Abstract
- <?Pub Dtl?>Analog Single Event Transients (ASETs) in two different shunt voltage references used in power management systems are investigated. Little has been published regarding how the dynamic parameter changes induced by external circuit design, such as time constant, damping coefficient or natural frequency affect ASET shapes. Modifications of the dynamic parameters of the circuit are measured by step response measurement. A correlation between dynamic parameters and ASET laser testing results is proposed. This study establishes the correlation between the dynamic parameters of a shunt voltage reference and ASET parameters such as pulse duration, and positive and negative amplitude. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 59
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 84360287
- Full Text :
- https://doi.org/10.1109/TNS.2012.2224127