Cite
Experimental Detection and Numerical Validation of Different Failure Mechanisms in IGBTs During Unclamped Inductive Switching.
MLA
Breglio, Giovanni, et al. “Experimental Detection and Numerical Validation of Different Failure Mechanisms in IGBTs During Unclamped Inductive Switching.” IEEE Transactions on Electron Devices, vol. 60, no. 2, Feb. 2013, pp. 563–70. EBSCOhost, https://doi.org/10.1109/TED.2012.2226177.
APA
Breglio, G., Irace, A., Napoli, E., Riccio, M., & Spirito, P. (2013). Experimental Detection and Numerical Validation of Different Failure Mechanisms in IGBTs During Unclamped Inductive Switching. IEEE Transactions on Electron Devices, 60(2), 563–570. https://doi.org/10.1109/TED.2012.2226177
Chicago
Breglio, Giovanni, Andrea Irace, Ettore Napoli, Michele Riccio, and Paolo Spirito. 2013. “Experimental Detection and Numerical Validation of Different Failure Mechanisms in IGBTs During Unclamped Inductive Switching.” IEEE Transactions on Electron Devices 60 (2): 563–70. doi:10.1109/TED.2012.2226177.