Cite
Investigation on origin of Z1/2 center in SiC by deep level transient spectroscopy and electron paramagnetic resonance.
MLA
Kawahara, Koutarou, et al. “Investigation on Origin of Z1/2 Center in SiC by Deep Level Transient Spectroscopy and Electron Paramagnetic Resonance.” Applied Physics Letters, vol. 102, no. 11, Mar. 2013, p. 112106. EBSCOhost, https://doi.org/10.1063/1.4796141.
APA
Kawahara, K., Thang Trinh, X., Tien Son, N., Janzén, E., Suda, J., & Kimoto, T. (2013). Investigation on origin of Z1/2 center in SiC by deep level transient spectroscopy and electron paramagnetic resonance. Applied Physics Letters, 102(11), 112106. https://doi.org/10.1063/1.4796141
Chicago
Kawahara, Koutarou, Xuan Thang Trinh, Nguyen Tien Son, Erik Janzén, Jun Suda, and Tsunenobu Kimoto. 2013. “Investigation on Origin of Z1/2 Center in SiC by Deep Level Transient Spectroscopy and Electron Paramagnetic Resonance.” Applied Physics Letters 102 (11): 112106. doi:10.1063/1.4796141.