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Dispersive one-dimensional (Mo/Si) nanocrystals for single molecular detection systems using x rays.

Authors :
Okumura, Yasuaki
Taniguchi, Yoshio
Sasaki, Yuji C.
Source :
Journal of Applied Physics. 12/15/2002, Vol. 92 Issue 12, p7469. 6p. 1 Black and White Photograph, 3 Diagrams, 5 Graphs.
Publication Year :
2002

Abstract

To directly observe the behavior of single molecules in real time and space, the x-ray methodology, diffracted x-ray tracking, has been proposed. This system monitors the spots of a diffracted x ray from individual nanocrystals, which are labeled with the individual single molecules. To operate single molecular detection systems with x rays, it is necessary to fabricate dispersive nanocrystals and observe the diffracted spots from the nanocrystals. We succeeded in fabrications of dispersive one-dimensional (Mo/Si) nanocrystals with diameters of approximately 25 nm using reactive ion etching. Furthermore, we monitored well-defined diffracted x-ray spots from Mo/Si nanocrystals (2.5 bilayers: Mo/Si/Mo/Si/Mo, d-space = 5.0 nm) in real time (2.0 ms). [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
*CRYSTALS
*X-rays
*MOLECULES

Details

Language :
English
ISSN :
00218979
Volume :
92
Issue :
12
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
8633531
Full Text :
https://doi.org/10.1063/1.1520721