Cite
An analytical model for read static noise margin including soft oxide breakdown, negative and positive bias temperature instabilities
MLA
Afzal, Behrouz, et al. “An Analytical Model for Read Static Noise Margin Including Soft Oxide Breakdown, Negative and Positive Bias Temperature Instabilities.” Microelectronics Reliability, vol. 53, no. 5, May 2013, pp. 670–75. EBSCOhost, https://doi.org/10.1016/j.microrel.2013.01.009.
APA
Afzal, B., Ebrahimi, B., Afzali-Kusha, A., & Mahmoodi, H. (2013). An analytical model for read static noise margin including soft oxide breakdown, negative and positive bias temperature instabilities. Microelectronics Reliability, 53(5), 670–675. https://doi.org/10.1016/j.microrel.2013.01.009
Chicago
Afzal, Behrouz, Behzad Ebrahimi, Ali Afzali-Kusha, and Hamid Mahmoodi. 2013. “An Analytical Model for Read Static Noise Margin Including Soft Oxide Breakdown, Negative and Positive Bias Temperature Instabilities.” Microelectronics Reliability 53 (5): 670–75. doi:10.1016/j.microrel.2013.01.009.