Generation/recovery mechanism of defects responsible for the permanent component in negative bias temperature instability.

MLA

Yonamoto, Yoshiki. “Generation/Recovery Mechanism of Defects Responsible for the Permanent Component in Negative Bias Temperature Instability.” Journal of Applied Physics, vol. 113, no. 15, Apr. 2013, p. 154501. EBSCOhost, https://doi.org/10.1063/1.4801884.

APA

Yonamoto, Y. (2013). Generation/recovery mechanism of defects responsible for the permanent component in negative bias temperature instability. Journal of Applied Physics, 113(15), 154501. https://doi.org/10.1063/1.4801884

Chicago

Yonamoto, Yoshiki. 2013. “Generation/Recovery Mechanism of Defects Responsible for the Permanent Component in Negative Bias Temperature Instability.” Journal of Applied Physics 113 (15): 154501. doi:10.1063/1.4801884.