Back to Search Start Over

Analysis of the Fault-Tolerance Capacity of the Multilevel Active-Clamped Converter.

Authors :
Nicolas-Apruzzese, Joan
Busquets-Monge, Sergio
Bordonau, Josep
Alepuz, Salvador
Calle-Prado, Alejandro
Source :
IEEE Transactions on Industrial Electronics. Nov2013, Vol. 60 Issue 11, p4773-4783. 11p.
Publication Year :
2013

Abstract

Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active-clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered, and the analysis is carried out under single-device and two simultaneous device faults. Switching strategies and different hardware modifications to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
02780046
Volume :
60
Issue :
11
Database :
Academic Search Index
Journal :
IEEE Transactions on Industrial Electronics
Publication Type :
Academic Journal
Accession number :
88057997
Full Text :
https://doi.org/10.1109/TIE.2012.2222856