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Phase retrieval technology for off-axis ellipsoid surface test with a high dynamic range algorithm.

Authors :
Xie, Chao
Li, Shengyi
Ding, Linyan
Chen, Shangyong
Source :
Optik - International Journal for Light & Electron Optics. Sep2013, Vol. 124 Issue 17, p2951-2954. 4p.
Publication Year :
2013

Abstract

Abstract: Phase retrieval technology for off-axis ellipsoid surface measurement with a high dynamic range algorithm is proposed in this paper. A high dynamic range algorithm (HDRA) for phase retrieval is proposed. We proved the validity of it in simulation. Then the HDRA is used to measure an off-axis ellipsoid. The measurement setup was established and the HDRA was applied to retrieve the surface shape of the off-axis ellipsoid. The experimental results show that the phase retrieval results are good agreement with that obtained by interferometer, which confirms the validity of this method. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00304026
Volume :
124
Issue :
17
Database :
Academic Search Index
Journal :
Optik - International Journal for Light & Electron Optics
Publication Type :
Academic Journal
Accession number :
89527780
Full Text :
https://doi.org/10.1016/j.ijleo.2012.09.026