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Phase retrieval technology for off-axis ellipsoid surface test with a high dynamic range algorithm.
- Source :
-
Optik - International Journal for Light & Electron Optics . Sep2013, Vol. 124 Issue 17, p2951-2954. 4p. - Publication Year :
- 2013
-
Abstract
- Abstract: Phase retrieval technology for off-axis ellipsoid surface measurement with a high dynamic range algorithm is proposed in this paper. A high dynamic range algorithm (HDRA) for phase retrieval is proposed. We proved the validity of it in simulation. Then the HDRA is used to measure an off-axis ellipsoid. The measurement setup was established and the HDRA was applied to retrieve the surface shape of the off-axis ellipsoid. The experimental results show that the phase retrieval results are good agreement with that obtained by interferometer, which confirms the validity of this method. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00304026
- Volume :
- 124
- Issue :
- 17
- Database :
- Academic Search Index
- Journal :
- Optik - International Journal for Light & Electron Optics
- Publication Type :
- Academic Journal
- Accession number :
- 89527780
- Full Text :
- https://doi.org/10.1016/j.ijleo.2012.09.026