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Investigation of single-walled carbon nanotubes with a low-energy electron point projection microscope.

Authors :
Ing-Shouh Hwang
Che-Cheng Chang
Chien-Hung Lu
Shih-Chin Liu
Yuan-Chih Chang
Ting-Kuo Lee
Horng-Tay Jeng
Hong-Shi Kuo
Chun-Yueh Lin
Chia-Seng Chang
Tien T. Tsong
Source :
New Journal of Physics. 2013, Vol. 15 Issue 4, p1-14. 14p.
Publication Year :
2013

Abstract

There has been controversy about the interpretation of the interference patterns recorded with low-energy electron point projection microscopy. With a highly coherent single-atom electron source, we have used a point projection microscope (PPM) to image a suspended and isolated single-walled carbon nanotube at different tip-sample separations. The nanotube and the surrounding structure are also imaged with a transmission electron microscope. Through numerical simulations, we can fit well the interference patterns of the nanotube recorded by the PPM at different separations. Our simulation results indicate that the interference patterns can be considered as electron holograms at large tip-sample separations (or small magnifications). However, at small tip-sample separations, the interference patterns are dominated by the biprism effect due to significant charge density induced on the nanotube, and thus, the interference patterns contain little information about the internal structure of the object. The results provide a reason why the images obtained by point projection microscopy so far have never achieved a resolution smaller than 2 nm. New research directions for achieving highresolution imaging of biological molecules with low-energy electrons are also discussed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
13672630
Volume :
15
Issue :
4
Database :
Academic Search Index
Journal :
New Journal of Physics
Publication Type :
Academic Journal
Accession number :
90222414
Full Text :
https://doi.org/10.1088/1367-2630/15/4/043015