Cite
X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires
MLA
Hesse, A., et al. “X-Ray Grazing Incidence Study of Inhomogeneous Strain Relaxation in Si/SiGe Wires.” Nuclear Instruments & Methods in Physics Research Section B, vol. 200, no. 1–4, Jan. 2003, p. 267. EBSCOhost, https://doi.org/10.1016/S0168-583X(02)01688-9.
APA
Hesse, A., Zhuang, Y., Holý, V., Stangl, J., Zerlauth, S., Schäffler, F., Bauer, G., Darowski, N., & Pietsch, U. (2003). X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires. Nuclear Instruments & Methods in Physics Research Section B, 200(1–4), 267. https://doi.org/10.1016/S0168-583X(02)01688-9
Chicago
Hesse, A., Y. Zhuang, V. Holý, J. Stangl, S. Zerlauth, F. Schäffler, G. Bauer, N. Darowski, and U. Pietsch. 2003. “X-Ray Grazing Incidence Study of Inhomogeneous Strain Relaxation in Si/SiGe Wires.” Nuclear Instruments & Methods in Physics Research Section B 200 (1–4): 267. doi:10.1016/S0168-583X(02)01688-9.