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Sensitization of Pr3+ ions by Eu2+ ions in CaF2 thin films deposited by evaporation.

Authors :
Guille, A.
Pereira, A.
Bensalah-Ledoux, A.
Moine, B.
Novotný, M.
Bulírˇ, J.
Fitl, P.
Lancˇok, J.
Source :
Journal of Applied Physics. Nov2013, Vol. 114 Issue 20, p203509. 4p. 1 Black and White Photograph, 5 Graphs.
Publication Year :
2013

Abstract

In the present article, we analyse the possibility of sensitizing the 3Pj levels of Pr3+ ion with Eu2+ ion in CaF2 thin film deposited by evaporation. Indeed, the forbidden nature of the 4f-4f transition of Pr3+ ion makes its absorption too weak for thin film applications, while materials doped with the Pr3+-Yb3+ couple are promising candidates for the achievement of efficient down-converter systems and could allow strong reduction of thermalization losses in silicon solar cells. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
114
Issue :
20
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
92660049
Full Text :
https://doi.org/10.1063/1.4836856