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Optical sectioning by wide-field photobleaching imprinting microscopy.
- Source :
-
Applied Physics Letters . 10/28/2013, Vol. 103 Issue 18, p183703. 4p. 4 Graphs. - Publication Year :
- 2013
-
Abstract
- We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluorescence decay. Since no specific fluorescent dyes or illumination modules are required, wide-field PIM is easy to implement on a standard microscope. Moreover, wide-field PIM is superior to deconvolution microscopy in removing background fluorescence, yielding a six-fold improvement in image contrast. [ABSTRACT FROM AUTHOR]
- Subjects :
- *MICROSCOPY
*PHOTONS
*FLUOROPHORES
*ELECTRONS
*POLYNOMIALS
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 103
- Issue :
- 18
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 92706442
- Full Text :
- https://doi.org/10.1063/1.4827535