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Feasibility of using sputtered AlO x film as gate insulator for high performance InGaZnO-TFTs.

Authors :
Li, Jun
Zhang, Jian-Hua
Ding, Xing-Wei
Zhu, Wen-Qing
Jiang, Xue-Yin
Zhang, Zhi-Lin
Source :
Superlattices & Microstructures. Jan2014, Vol. 65, p14-21. 8p.
Publication Year :
2014

Abstract

Highlights: [•] Sputtered AlO x film as the gate insulator. [•] Effect of rf power on the electrical properties of AlO x insulator. [•] Electrical performance and bias stability of InGaZnO-TFTs. [•] Interfacial properties using C–V method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07496036
Volume :
65
Database :
Academic Search Index
Journal :
Superlattices & Microstructures
Publication Type :
Academic Journal
Accession number :
93349373
Full Text :
https://doi.org/10.1016/j.spmi.2013.10.032