Properties of the new electronic device material La GdO3.

The room temperature crystal structure of potential high- k dielectric LaGdO3 has been analyzed by X-ray diffraction techniques and its structural evolution with temperature has been probed by Raman spectroscopy. Rietveld refinement of the ambient XRD data established the perfectly layered B-type monoclinic crystal structure with a = 14.43 Å, b = 3.68 Å, c = 8.99 Å, and β = 100.57° which is further validated by the 21 (14 Ag and 7 Bg) Raman-active vibrational modes with centro-symmetric space group [ABSTRACT FROM AUTHOR]