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Excellent Current Drivability and Environmental Stability in Room-Temperature-Fabricated Pentacene-Based Organic Field-Effect Transistors With HfO2 Gate Insulators.

Authors :
Liao, Min
Ishiwara, Hiroshi
Ohmi, Shun-Ichiro
Source :
IEEE Transactions on Electron Devices. Feb2014, Vol. 61 Issue 2, p569-575. 7p.
Publication Year :
2014

Abstract

Low-voltage-operating pentacene-based organic field-effect transistors (OFETs) with HfO2 gate insulators have been fabricated at room temperature. Despite its thin capacitance equivalent thickness of 3.6 nm, the room-temperature-processed HfO2 gate insulator shows a low leakage current density of 1.2\times 10^-7~A/cm^2 at a gate voltage of -2~V. Pentacene films grown on the HfO2 gate insulators have a large grain size and a highly ordered molecular structure due to the appropriate surface properties of the HfO2 gate insulators. The as-fabricated pentacene-based OFET (W/L=1300~\mum/100~\mum) with a HfO2 gate insulator has a low subthreshold swing of 0.13 V/decade, a large ON/OFF current ratio of 9.8\times 10^\rm\bf 4, and a high hole mobility of 0.34 cm^2V^-1s^-1 at an operating voltage of -2~V. Furthermore, the environmental stability in the room-temperature-fabricated pentacene-based OFETs with HfO2 gate insulators was investigated. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
61
Issue :
2
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
94016440
Full Text :
https://doi.org/10.1109/TED.2013.2292904