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Excellent Current Drivability and Environmental Stability in Room-Temperature-Fabricated Pentacene-Based Organic Field-Effect Transistors With HfO2 Gate Insulators.
- Source :
-
IEEE Transactions on Electron Devices . Feb2014, Vol. 61 Issue 2, p569-575. 7p. - Publication Year :
- 2014
-
Abstract
- Low-voltage-operating pentacene-based organic field-effect transistors (OFETs) with HfO2 gate insulators have been fabricated at room temperature. Despite its thin capacitance equivalent thickness of 3.6 nm, the room-temperature-processed HfO2 gate insulator shows a low leakage current density of 1.2\times 10^-7~A/cm^2 at a gate voltage of -2~V. Pentacene films grown on the HfO2 gate insulators have a large grain size and a highly ordered molecular structure due to the appropriate surface properties of the HfO2 gate insulators. The as-fabricated pentacene-based OFET (W/L=1300~\mum/100~\mum) with a HfO2 gate insulator has a low subthreshold swing of 0.13 V/decade, a large ON/OFF current ratio of 9.8\times 10^\rm\bf 4, and a high hole mobility of 0.34 cm^2V^-1s^-1 at an operating voltage of -2~V. Furthermore, the environmental stability in the room-temperature-fabricated pentacene-based OFETs with HfO2 gate insulators was investigated. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 61
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 94016440
- Full Text :
- https://doi.org/10.1109/TED.2013.2292904