Cite
Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability.
MLA
Gaboriaud, R. J., et al. “Synthesis, Structuring and Characterization of Rare Earth Oxide Thin Films: Modeling of the Effects of Stress and Defects on the Phase Stability.” Thin Solid Films, vol. 553, Feb. 2014, pp. 43–46. EBSCOhost, https://doi.org/10.1016/j.tsf.2013.12.035.
APA
Gaboriaud, R. J., Paumier, F., & Lacroix, B. (2014). Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability. Thin Solid Films, 553, 43–46. https://doi.org/10.1016/j.tsf.2013.12.035
Chicago
Gaboriaud, R.J., F. Paumier, and B. Lacroix. 2014. “Synthesis, Structuring and Characterization of Rare Earth Oxide Thin Films: Modeling of the Effects of Stress and Defects on the Phase Stability.” Thin Solid Films 553 (February): 43–46. doi:10.1016/j.tsf.2013.12.035.