Cite
Polarity characterization by anomalous x-ray dispersion of ZnO films and GaN lateral polar structures.
MLA
Shelton, Christopher T., et al. “Polarity Characterization by Anomalous X-Ray Dispersion of ZnO Films and GaN Lateral Polar Structures.” Journal of Applied Physics, vol. 115, no. 4, Jan. 2014, pp. 1–6. EBSCOhost, https://doi.org/10.1063/1.4863120.
APA
Shelton, C. T., Sachet, E., Paisley, E. A., Hoffmann, M. P., Rajan, J., Collazo, R., Sitar, Z., & Maria, J.-P. (2014). Polarity characterization by anomalous x-ray dispersion of ZnO films and GaN lateral polar structures. Journal of Applied Physics, 115(4), 1–6. https://doi.org/10.1063/1.4863120
Chicago
Shelton, Christopher T., Edward Sachet, Elizabeth A. Paisley, Marc P. Hoffmann, Joseph Rajan, Ramón Collazo, Zlatko Sitar, and Jon-Paul Maria. 2014. “Polarity Characterization by Anomalous X-Ray Dispersion of ZnO Films and GaN Lateral Polar Structures.” Journal of Applied Physics 115 (4): 1–6. doi:10.1063/1.4863120.