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Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications.
- Source :
-
Radiation Measurements . Mar2014, Vol. 62, p28-34. 7p. - Publication Year :
- 2014
-
Abstract
- Abstract: In this work, a group of Lu2SiO5:Tb (LSO:Tb) scintillating layers with a Tb concentration between 8% and 19% were investigated by means of synchrotron and laboratory techniques. The scintillation efficiency measurements proved that the highest light yield is obtained for a Tb concentration equal to 15%. At higher concentration, quenching processes occur which lower the light emission. The analysis of the reciprocal space maps of the (082) (280) and (040) Bragg reflections showed that LSO:Tb epilayers are well adapted on YbSO substrates for all the investigated concentrations. The spatial resolution tests demonstrated the possibility to achieve a resolution of 1 μm with a 6 μm thick scintillating layer. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 13504487
- Volume :
- 62
- Database :
- Academic Search Index
- Journal :
- Radiation Measurements
- Publication Type :
- Academic Journal
- Accession number :
- 94794753
- Full Text :
- https://doi.org/10.1016/j.radmeas.2013.12.005