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Deep submicron changes the face of verification.
- Source :
-
Computer Design . Oct1995, Vol. 34 Issue 10, p85. 7p. 1 Color Photograph, 1 Diagram, 1 Chart. - Publication Year :
- 1995
-
Abstract
- Discusses coping with deep submicron in integrated circuit (IC) design. Static-timing analysis; Timing consistency; Static, dynamic timing; Cost versus time; Emulation for submicron application specific integrated circuits (ASIC); Simulating at high level; Accelerating simulation; Formal verification. INSETS: Using formal verification for.., by Christian Berthet.;Five-million-gate ASIC project signed off with static...
- Subjects :
- *INTEGRATED circuit design
Subjects
Details
- Language :
- English
- ISSN :
- 00104566
- Volume :
- 34
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Computer Design
- Publication Type :
- Periodical
- Accession number :
- 9510202605