Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip.

We have observed a cleaved NiO(100) surface by means of non-contact atomic force microscopy (NC-AFM) using a Fe-coated tip. The shape and magnetic properties of the Fe-coated tip are confirmed by ex situ scanning electron microscopy (SEM) and magnetic force microscopy (MFM) imaging. Also, in situ Δf-vmeasurement shows that the contact-potential difference (CPD) is different between non-coated Si and Fe-coated tips. The Fe-coated tip can produce atomically resolved NC-AFM images of a cleaved NiO(100) surface at room temperature. [ABSTRACT FROM AUTHOR]