Cite
On-Chip Process and Temperature Monitor for Self-Adjusting Slew Rate Control of 2\,\times\,VDD Output Buffers.
MLA
Wang, Chua-Chin, et al. “On-Chip Process and Temperature Monitor for Self-Adjusting Slew Rate Control of 2\,\times\,VDD Output Buffers.” IEEE Transactions on Circuits & Systems. Part I: Regular Papers, vol. 60, no. 6, June 2013, pp. 1432–40. EBSCOhost, https://doi.org/10.1109/TCSI.2012.2226515.
APA
Wang, C.-C., Chen, C.-L., Kuo, R.-C., Tseng, H.-Y., Liu, J.-W., & Juan, C.-Y. (2013). On-Chip Process and Temperature Monitor for Self-Adjusting Slew Rate Control of 2\,\times\,VDD Output Buffers. IEEE Transactions on Circuits & Systems. Part I: Regular Papers, 60(6), 1432–1440. https://doi.org/10.1109/TCSI.2012.2226515
Chicago
Wang, Chua-Chin, Chih-Lin Chen, Ron-Chi Kuo, Hsin-Yuan Tseng, Jen-Wei Liu, and Chun-Ying Juan. 2013. “On-Chip Process and Temperature Monitor for Self-Adjusting Slew Rate Control of 2\,\times\,VDD Output Buffers.” IEEE Transactions on Circuits & Systems. Part I: Regular Papers 60 (6): 1432–40. doi:10.1109/TCSI.2012.2226515.