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Picosecond Resolution Time-to-Digital Converter Using Gm \-C Integrator and SAR-ADC.
- Source :
-
IEEE Transactions on Nuclear Science . Mar2014, Vol. 61 Issue 2, p852-859. 8p. - Publication Year :
- 2014
-
Abstract
- A picosecond resolution time-to-digital converter (TDC) is presented. The resolution of a conventional delay chain TDC is limited by the delay of a logic buffer. Various types of recent TDCs are successful in breaking this limitation, but they require a significant calibration effort to achieve picosecond resolution with a sufficient linear range. To address these issues, we propose a simple method to break the resolution limitation without any calibration: a Gm \-C integrator followed by a successive approximation register analog-to-digital converter (SAR-ADC). This translates the time interval into charge, and then the charge is quantized. A prototype chip was fabricated in 90 nm CMOS. The measurement results reveal a 1 ps resolution, a -0.6/0.7 LSB differential nonlinearity (DNL), a -1.1/2.3 LSB integral nonlinearity (INL), and a 9-bit range. The measured 11.74 ps single-shot precision is caused by the noise of the integrator. We analyze the noise of the integrator and propose an improved front-end circuit to reduce this noise. The proposal is verified by simulations showing the maximum single-shot precision is less than 1 ps. The proposed front-end circuit can also diminish the mismatch effects. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 61
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 95634679
- Full Text :
- https://doi.org/10.1109/TNS.2014.2309652