Cite
Experimental Evidence Toward Understanding Charge Pumping Signals in 3-D Devices With Poly-Si Channel.
MLA
Tang, Baojun, et al. “Experimental Evidence Toward Understanding Charge Pumping Signals in 3-D Devices With Poly-Si Channel.” IEEE Transactions on Electron Devices, vol. 61, no. 5, May 2014, pp. 1501–07. EBSCOhost, https://doi.org/10.1109/TED.2014.2313038.
APA
Tang, B., Zhang, W., Toledano-Luque, M., Zhang, J. F., Degraeve, R., Ji, Z., Arreghini, A., Van den Bosch, G., & Van Houdt, J. (2014). Experimental Evidence Toward Understanding Charge Pumping Signals in 3-D Devices With Poly-Si Channel. IEEE Transactions on Electron Devices, 61(5), 1501–1507. https://doi.org/10.1109/TED.2014.2313038
Chicago
Tang, Baojun, Weidong Zhang, Maria Toledano-Luque, Jian Fu Zhang, Robin Degraeve, Zhigang Ji, Antonio Arreghini, Geert Van den Bosch, and Jan Van Houdt. 2014. “Experimental Evidence Toward Understanding Charge Pumping Signals in 3-D Devices With Poly-Si Channel.” IEEE Transactions on Electron Devices 61 (5): 1501–7. doi:10.1109/TED.2014.2313038.