Error Correction Schemes with Erasure Information for Fast Memories.

MLA

Evain, Samuel, et al. “Error Correction Schemes with Erasure Information for Fast Memories.” Journal of Electronic Testing, vol. 30, no. 2, Apr. 2014, pp. 183–92. EBSCOhost, https://doi.org/10.1007/s10836-014-5440-1.

APA

Evain, S., Savin, V., & Gherman, V. (2014). Error Correction Schemes with Erasure Information for Fast Memories. Journal of Electronic Testing, 30(2), 183–192. https://doi.org/10.1007/s10836-014-5440-1

Chicago

Evain, Samuel, Valentin Savin, and Valentin Gherman. 2014. “Error Correction Schemes with Erasure Information for Fast Memories.” Journal of Electronic Testing 30 (2): 183–92. doi:10.1007/s10836-014-5440-1.