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ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements.

Authors :
Meneghini, Matteo
Vaccari, Simone
Lago, Matteo Dal
Marconi, Stefano
Barbato, Marco
Trivellin, Nicola
Griffoni, Alessio
Alfier, Alberto
Verzellesi, Giovanni
Meneghesso, Gaudenzio
Zanoni, Enrico
Source :
Microelectronics Reliability. Jun2014, Vol. 54 Issue 6/7, p1143-1149. 7p.
Publication Year :
2014

Abstract

Highlights: [•] Analysis of the robustness of RGB LEDs and LED modules submitted to ESD. [•] Description of the correlation between semiconductor material and ESD failure threshold. [•] Analysis of the dependence on the failure threshold of the individual LEDs in the chain. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262714
Volume :
54
Issue :
6/7
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
96233869
Full Text :
https://doi.org/10.1016/j.microrel.2014.02.009