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Useful lifetime analysis for high-power white LEDs.
- Source :
-
Microelectronics Reliability . Jun2014, Vol. 54 Issue 6/7, p1307-1315. 9p. - Publication Year :
- 2014
-
Abstract
- Highlights: [•] The degradation-data-driven method is used to analyze the lifetime of HPWLEDs. [•] We present a bi-exponential model to improve the fit accuracy for the data. [•] The two-stage method provides the highest ability to explain variation. [•] A response model was used to predict the useful lifetime. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00262714
- Volume :
- 54
- Issue :
- 6/7
- Database :
- Academic Search Index
- Journal :
- Microelectronics Reliability
- Publication Type :
- Academic Journal
- Accession number :
- 96233891
- Full Text :
- https://doi.org/10.1016/j.microrel.2014.02.029