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Measurement of semiconductor optical index variation in photonic devices based on optical heterodyning microwave experiments.

Authors :
Dupont, S.
Blary, K.
Vilcot, J.-P.
Li, H.W.
Decoster, D.
Chazelas, J.
Source :
Electronics Letters (Institution of Engineering & Technology). 2/6/2003, Vol. 39 Issue 3, p295. 2p.
Publication Year :
2003

Abstract

Measures the variation of propagation effective index of integrated optics devices using an heterodyne detection scheme. Direct transfer of optical phase shift in the microwave frequency range allowing phase measurements using common microwave network; Application of the technique to a digital optical switch-technique based switch.

Details

Language :
English
ISSN :
00135194
Volume :
39
Issue :
3
Database :
Academic Search Index
Journal :
Electronics Letters (Institution of Engineering & Technology)
Publication Type :
Academic Journal
Accession number :
9654440
Full Text :
https://doi.org/10.1049/el:20030224