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Moving toward system-on-a-chip testability.
- Source :
-
Computer Design . Oct1997, Vol. 36 Issue 10, p17. 2p. 1 Diagram. - Publication Year :
- 1997
-
Abstract
- Reports on the move for a testability standards for application specific integrated circuit (ASIC). Two organizations that devoting their efforts to this challenge; Focus of Institute of Electrical and Electronics Engineer (IEEE) P1500 working group; Other testability option.
- Subjects :
- *APPLICATION-specific integrated circuits
*TESTING
Subjects
Details
- Language :
- English
- ISSN :
- 00104566
- Volume :
- 36
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Computer Design
- Publication Type :
- Periodical
- Accession number :
- 9710280995