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Experimental study of grain boundary orientations in multi-crystalline silicon.
- Source :
-
Journal of Crystal Growth . Sep2014, Vol. 401, p404-408. 5p. - Publication Year :
- 2014
-
Abstract
- Some peculiarities of straight and zig-zag grain boundaries in multi-crystalline Si ingots were analyzed by Scanning Electron Microscopy-Electron BackScatter Diffraction (SEM-EBSD) and Three Dimensional (3D) grain boundary reconstruction. In the cases where straight grain boundaries were perpendicular to facing {111} planes in the two neighboring grains, they were found parallel, within the measurement accuracy, to the bisector of the two facing {111} planes. This is in agreement with the theory predicting the existence of Facetted-Facetted grooves during the growth of multicrystalline Si. Another grain boundary was corresponding to the predicted Facetted-Rough groove. It was found that the zig-zag grain boundaries were successively composed of {111} twin planes and (...11)/(011) planes, so that the two grains are always in Σ3 relationship. The phenomenon leading to the formation mechanism for these boundaries remains a subject for research. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00220248
- Volume :
- 401
- Database :
- Academic Search Index
- Journal :
- Journal of Crystal Growth
- Publication Type :
- Academic Journal
- Accession number :
- 97204294
- Full Text :
- https://doi.org/10.1016/j.jcrysgro.2013.12.047