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Fast scanning tunneling microscope for dynamic observation.
- Source :
-
Review of Scientific Instruments . Apr90, Vol. 61 Issue 4, p1342. 2p. - Publication Year :
- 1990
-
Abstract
- A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning. [ABSTRACT FROM AUTHOR]
- Subjects :
- *SCANNING tunneling microscopy
*SCIENTIFIC apparatus & instruments
Subjects
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 61
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 9780582
- Full Text :
- https://doi.org/10.1063/1.1141189