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Fast scanning tunneling microscope for dynamic observation.

Authors :
Hosaka, Sumio
Hasegawa, Tsuyoshi
Hosoki, Shigeyuki
Takata, Keiji
Source :
Review of Scientific Instruments. Apr90, Vol. 61 Issue 4, p1342. 2p.
Publication Year :
1990

Abstract

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
61
Issue :
4
Database :
Academic Search Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
9780582
Full Text :
https://doi.org/10.1063/1.1141189